Category Archives: PVT window of failure bugs
Characterising rather than thinking
Timing closure is always an issue and more so at high clock frequencies where the period can be little over a nanosecond. If you can be provided with faster standard cells it can make all the difference. But can you
Characterising rather than thinking
Timing closure is always an issue and more so at high clock frequencies where the period can be little over a nanosecond. If you can be provided with faster standard cells it can make all the difference. But can you
Delay cells "consuming" fast strobes
The device was booting the on-chip processor perfectly when it was tested on the bench. The Operating System was reliably coming up. This is an excellent sign in any device’s bring up and validation process, as it shows (rather than
Delay cells "consuming" fast strobes
The device was booting the on-chip processor perfectly when it was tested on the bench. The Operating System was reliably coming up. This is an excellent sign in any device’s bring up and validation process, as it shows (rather than
When silicon fails.. 